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Reliability Equivalence Analysis of a Parallel-Series System Subject to Degradation Facility
Science Journal of Applied Mathematics and Statistics
Volume 3, Issue 3, June 2015, Pages: 160-164
Received: May 13, 2015; Accepted: May 26, 2015; Published: Jun. 8, 2015
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Author
M. A. El-Damcese, Department of Mathematics, Faculty of Science, Tanta University, Tanta, Egypt
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Abstract
The performance of a reliability system can be improved by different methods, e.g. the reliability of one or more components can be improved, hot or cold redundant components can be added to the system. Sometimes these measures can be equivalent as they will have the same effect on some performance measure of the system. This paper discusses the reliability equivalences of a parallel–series system. The system considered here consists of m subsystems connected in parallel, with subsystem i consisting of ni independent and identical components in series for i=1, 2, …, m. Three different methods are used to improve the system reliability: (i) the reduction method, (ii) the hot duplication method and (iii) the cold duplication method. Each component of the system has four states and two types of partial failure rates. In this study, the lifetimes of the system components are exponentially distributed. A numerical example is introduced to illustrate how the idea of this work can be applied.
Keywords
Partial Failure Rate, Reliability Equivalence Factors, Parallel-Series System
To cite this article
M. A. El-Damcese, Reliability Equivalence Analysis of a Parallel-Series System Subject to Degradation Facility, Science Journal of Applied Mathematics and Statistics. Vol. 3, No. 3, 2015, pp. 160-164. doi: 10.11648/j.sjams.20150303.19
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