Optical, Morphological and Electrical Properties of Silver and Aluminium Metallization Contacts for Solar Cells
American Journal of Modern Physics
Volume 3, Issue 2, March 2014, Pages: 45-50
Received: Jan. 21, 2014;
Published: Feb. 28, 2014
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Zakia Fekkai, Department of Physics, College of Sciences, Al Imam Mohammad Ibn Saud Islamic University (IMSIU), Riyadh, Saudi Arabia
Nazir Mustapha, Department of Physics, College of Sciences, Al Imam Mohammad Ibn Saud Islamic University (IMSIU), Riyadh, Saudi Arabia
Ali Hennache, Department of Physics, College of Sciences, Al Imam Mohammad Ibn Saud Islamic University (IMSIU), Riyadh, Saudi Arabia
A lower resistivity and better spectra selectivity is a measurement of the quality and potential use of silver Ag and aluminium Al metals for the application as metallization contacts for solar cells. Aluminium (Al) and silver (Ag) thin films deposited by thermal evaporation at room temperature were dense with small grain sizes, and maintained a high value of reflectance (in the spectral range from 300 to 3200 nm) with annealing at 300 °C in an argon atmosphere. Experimental results indicate that the surface roughness is increased while the film’s resistivities are reduced. It was also found that the surface roughness and work function of metal films are very important to enhance the stability and efficiency of electrode thin films used for solar cells.
Optical, Morphological and Electrical Properties of Silver and Aluminium Metallization Contacts for Solar Cells, American Journal of Modern Physics.
Vol. 3, No. 2,
2014, pp. 45-50.
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