Low-Loss Propagation in Semiconductor AlxGa1-xAs Waveguide
American Journal of Modern Physics
Volume 3, Issue 6, November 2014, Pages: 254-256
Received: Nov. 11, 2014; Accepted: Dec. 11, 2014; Published: Dec. 19, 2014
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Latef M. Ali, Hawler Technical Institute, Kurdistan Region, Iraq
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We theoretically studied the effect of a metal dimensions on the propagation loss of surface plasmon polaritons (SPPs) in a metal-semiconductor-semiconductor (MSS). The propagation loss of surface plasmon polaritons (SPPs) is studied at the interfaces between metals and active media .The propagation loss is calculated at the wavelength λ=1550nm for different widths and thicknesses of a gold layer. Also it has been observed the variation of the propagation loss with the height of the AlxGa1-xAs which is between the gold film and high refractive semiconductor. We analyze metal-semiconductor-semiconductor (MSS) waveguide by using the effective-index method (EIM) and the finite-difference-time-domain (FDTD) methods.
Surface Plasmon Polaritons (SPPs), Metal-Semiconductor- Semiconductor Waveguides Propagation Loss
To cite this article
Latef M. Ali, Low-Loss Propagation in Semiconductor AlxGa1-xAs Waveguide, American Journal of Modern Physics. Vol. 3, No. 6, 2014, pp. 254-256. doi: 10.11648/j.ajmp.20140306.19
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