International Journal of Materials Science and Applications

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Influence of Thiourea Concentration on Some Physical Properties of Chemically Sprayed Cu2ZnSnS4 Thin Films

Received: 28 September 2016    Accepted: 07 October 2016    Published: 01 November 2016
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Abstract

In this work Cu2ZnSnS4 (CZTS) films were deposited by using chemical spray pyrolysis (CSP) technique at substrate temperature of (400 ± 10) °C and thickness of about (300 ± 10) nm at different Thiourea Concentrations of (0.14, 0.16, 0.18, 0.20, 0.22 and 0.24) M. Copper chloride (CuCl), zinc chloride (ZnCl2), tin chloride (SnCl4.5H2O) and thiourea (SC(NH2)2) were used as sources of copper ions, zinc ions, tin ions and sulfur ions respectively. The structural, morphological and optical properties of these films have been studied using XRD, AFM, and UV-Visible spectroscopy respectively. The XRD results showed that all films are polycrystalline in nature with tetragonal structure and preferred orientation along (112) plane. The crystallite size (Dav) of all samples was calculated using Scherrer’s equation and it is found that the sample deposited at thiourea concentration of 0.20 M has maximum crystallite size of 31.25 nm, while it was minimum (18.02 nm) for the sample prepared at thiourea concentration of 0.16 M. The AFM results showed smooth and homogenous thin films. The optical energy band gap (Eg) for allowed direct electronic transition was calculated using Tauc’s plot. It is found that the energy band gap (Eg) decreases as the thiourea concentration increases and it was in the range of (2.22 - 1.75) eV. Urbach energy, refractive index, extinction coefficient and dielectric coefficient of all deposited films were estimated and the results were discussed.

DOI 10.11648/j.ijmsa.20160506.15
Published in International Journal of Materials Science and Applications (Volume 5, Issue 6, November 2016)
Page(s) 261-270
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This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.

Copyright

Copyright © The Author(s), 2024. Published by Science Publishing Group

Keywords

CZTS Thin Films, Thiourea Concentration, Chemical Spray Pyrolysis, XRD, Optical Properties

References
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Author Information
  • Department of Physics, College of Science, University of Diyala, Diyala, Iraq

  • Department of Physics, College of Science, University of Diyala, Diyala, Iraq

  • Department of Physics, College of Science, University of Diyala, Diyala, Iraq

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    Nabeel A. Bakr, Ziad T. Khodair, Hussein I. Mahdi. (2016). Influence of Thiourea Concentration on Some Physical Properties of Chemically Sprayed Cu2ZnSnS4 Thin Films. International Journal of Materials Science and Applications, 5(6), 261-270. https://doi.org/10.11648/j.ijmsa.20160506.15

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    Nabeel A. Bakr; Ziad T. Khodair; Hussein I. Mahdi. Influence of Thiourea Concentration on Some Physical Properties of Chemically Sprayed Cu2ZnSnS4 Thin Films. Int. J. Mater. Sci. Appl. 2016, 5(6), 261-270. doi: 10.11648/j.ijmsa.20160506.15

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    AMA Style

    Nabeel A. Bakr, Ziad T. Khodair, Hussein I. Mahdi. Influence of Thiourea Concentration on Some Physical Properties of Chemically Sprayed Cu2ZnSnS4 Thin Films. Int J Mater Sci Appl. 2016;5(6):261-270. doi: 10.11648/j.ijmsa.20160506.15

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  • @article{10.11648/j.ijmsa.20160506.15,
      author = {Nabeel A. Bakr and Ziad T. Khodair and Hussein I. Mahdi},
      title = {Influence of Thiourea Concentration on Some Physical Properties of Chemically Sprayed Cu2ZnSnS4 Thin Films},
      journal = {International Journal of Materials Science and Applications},
      volume = {5},
      number = {6},
      pages = {261-270},
      doi = {10.11648/j.ijmsa.20160506.15},
      url = {https://doi.org/10.11648/j.ijmsa.20160506.15},
      eprint = {https://download.sciencepg.com/pdf/10.11648.j.ijmsa.20160506.15},
      abstract = {In this work Cu2ZnSnS4 (CZTS) films were deposited by using chemical spray pyrolysis (CSP) technique at substrate temperature of (400 ± 10) °C and thickness of about (300 ± 10) nm at different Thiourea Concentrations of (0.14, 0.16, 0.18, 0.20, 0.22 and 0.24) M. Copper chloride (CuCl), zinc chloride (ZnCl2), tin chloride (SnCl4.5H2O) and thiourea (SC(NH2)2) were used as sources of copper ions, zinc ions, tin ions and sulfur ions respectively. The structural, morphological and optical properties of these films have been studied using XRD, AFM, and UV-Visible spectroscopy respectively. The XRD results showed that all films are polycrystalline in nature with tetragonal structure and preferred orientation along (112) plane. The crystallite size (Dav) of all samples was calculated using Scherrer’s equation and it is found that the sample deposited at thiourea concentration of 0.20 M has maximum crystallite size of 31.25 nm, while it was minimum (18.02 nm) for the sample prepared at thiourea concentration of 0.16 M. The AFM results showed smooth and homogenous thin films. The optical energy band gap (Eg) for allowed direct electronic transition was calculated using Tauc’s plot. It is found that the energy band gap (Eg) decreases as the thiourea concentration increases and it was in the range of (2.22 - 1.75) eV. Urbach energy, refractive index, extinction coefficient and dielectric coefficient of all deposited films were estimated and the results were discussed.},
     year = {2016}
    }
    

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  • TY  - JOUR
    T1  - Influence of Thiourea Concentration on Some Physical Properties of Chemically Sprayed Cu2ZnSnS4 Thin Films
    AU  - Nabeel A. Bakr
    AU  - Ziad T. Khodair
    AU  - Hussein I. Mahdi
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    DO  - 10.11648/j.ijmsa.20160506.15
    T2  - International Journal of Materials Science and Applications
    JF  - International Journal of Materials Science and Applications
    JO  - International Journal of Materials Science and Applications
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    EP  - 270
    PB  - Science Publishing Group
    SN  - 2327-2643
    UR  - https://doi.org/10.11648/j.ijmsa.20160506.15
    AB  - In this work Cu2ZnSnS4 (CZTS) films were deposited by using chemical spray pyrolysis (CSP) technique at substrate temperature of (400 ± 10) °C and thickness of about (300 ± 10) nm at different Thiourea Concentrations of (0.14, 0.16, 0.18, 0.20, 0.22 and 0.24) M. Copper chloride (CuCl), zinc chloride (ZnCl2), tin chloride (SnCl4.5H2O) and thiourea (SC(NH2)2) were used as sources of copper ions, zinc ions, tin ions and sulfur ions respectively. The structural, morphological and optical properties of these films have been studied using XRD, AFM, and UV-Visible spectroscopy respectively. The XRD results showed that all films are polycrystalline in nature with tetragonal structure and preferred orientation along (112) plane. The crystallite size (Dav) of all samples was calculated using Scherrer’s equation and it is found that the sample deposited at thiourea concentration of 0.20 M has maximum crystallite size of 31.25 nm, while it was minimum (18.02 nm) for the sample prepared at thiourea concentration of 0.16 M. The AFM results showed smooth and homogenous thin films. The optical energy band gap (Eg) for allowed direct electronic transition was calculated using Tauc’s plot. It is found that the energy band gap (Eg) decreases as the thiourea concentration increases and it was in the range of (2.22 - 1.75) eV. Urbach energy, refractive index, extinction coefficient and dielectric coefficient of all deposited films were estimated and the results were discussed.
    VL  - 5
    IS  - 6
    ER  - 

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