Cd1-хMnхTe(x=0.05) thin films have been obtained on mica substrates. The surface morphology of samples examined with scanning electron analytical microscope JEOL JSM 7600F and AFM. We obtained Cd1-xMnxTe (х=0.05) thin films of high perfection with smooth and glossy surface and having homogeneous composition of Cd, Te, Mn. The crystal structure of obtained samples was investigated by x-ray diffraction method. It has been found that the synthesized samples and films obtained on mica substrates have a polycrystalline structure and indicated on the base of cubic lattice. It has been studied the impact of γ-irradiation on structure of Cd1-хMnхTe (x=0.05) thin films. The samples were irradiated by γ-ray 3 times at T=300 K. After irradiation the intensity in X-ray diffraction patterns is changed. The x-ray patterns of non-irradiated samples showed all the characteristic scattering peaks. While, the x-ray patterns of irradiated sample appeared different. The irradiated samples showed less degree of crystallinity as evidenced by fewer peaks of lower intensity. We have investigated the influence of -radiation on electrophysical properties of Cd1-хMnхTе thin films at T=300 K. Samples were irradiated 3 times by γ-ray at Dϒ=1051krad doses. As a result the VAC has changed after irradiation in dependence of -irradiation dose. The resistance is changed too. After γ-irradiation till D=30krad doses the photosensitivity is increased but the further increasing of doses leads to disappearing of sensitivity.
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International Journal of Materials Science and Applications (Volume 3, Issue 6-1)
This article belongs to the Special Issue Materials Science |
| DOI | 10.11648/j.ijmsa.s.2014030601.15 |
| Page(s) | 20-23 |
| Creative Commons |
This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited. |
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Copyright © The Author(s), 2024. Published by Science Publishing Group |
Semimagnetic Semiconductor, Thin Film, Crystal Structure, Substrate, X-Ray Diffraction Method, Sensitivity, Photoconductivity, VAC
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APA Style
M. A. Mehrabova, H. R. Nuriyev, T. B. Taghiyev, R. M. Sadigov, A. M. Nazarov, et al. (2014). Impact of γ-Irradition on Srtucture and Electrophysical Properties of CdMnTe. International Journal of Materials Science and Applications, 3(6-1), 20-23. https://doi.org/10.11648/j.ijmsa.s.2014030601.15
ACS Style
M. A. Mehrabova; H. R. Nuriyev; T. B. Taghiyev; R. M. Sadigov; A. M. Nazarov, et al. Impact of γ-Irradition on Srtucture and Electrophysical Properties of CdMnTe. Int. J. Mater. Sci. Appl. 2014, 3(6-1), 20-23. doi: 10.11648/j.ijmsa.s.2014030601.15
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Download@article{10.11648/j.ijmsa.s.2014030601.15,
author = {M. A. Mehrabova and H. R. Nuriyev and T. B. Taghiyev and R. M. Sadigov and A. M. Nazarov and N. I. Huseynov},
title = {Impact of γ-Irradition on Srtucture and Electrophysical Properties of CdMnTe},
journal = {International Journal of Materials Science and Applications},
volume = {3},
number = {6-1},
pages = {20-23},
doi = {10.11648/j.ijmsa.s.2014030601.15},
url = {https://doi.org/10.11648/j.ijmsa.s.2014030601.15},
eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ijmsa.s.2014030601.15},
abstract = {Cd1-хMnхTe(x=0.05) thin films have been obtained on mica substrates. The surface morphology of samples examined with scanning electron analytical microscope JEOL JSM 7600F and AFM. We obtained Cd1-xMnxTe (х=0.05) thin films of high perfection with smooth and glossy surface and having homogeneous composition of Cd, Te, Mn. The crystal structure of obtained samples was investigated by x-ray diffraction method. It has been found that the synthesized samples and films obtained on mica substrates have a polycrystalline structure and indicated on the base of cubic lattice. It has been studied the impact of γ-irradiation on structure of Cd1-хMnхTe (x=0.05) thin films. The samples were irradiated by γ-ray 3 times at T=300 K. After irradiation the intensity in X-ray diffraction patterns is changed. The x-ray patterns of non-irradiated samples showed all the characteristic scattering peaks. While, the x-ray patterns of irradiated sample appeared different. The irradiated samples showed less degree of crystallinity as evidenced by fewer peaks of lower intensity. We have investigated the influence of -radiation on electrophysical properties of Cd1-хMnхTе thin films at T=300 K. Samples were irradiated 3 times by γ-ray at Dϒ=1051krad doses. As a result the VAC has changed after irradiation in dependence of -irradiation dose. The resistance is changed too. After γ-irradiation till D=30krad doses the photosensitivity is increased but the further increasing of doses leads to disappearing of sensitivity.},
year = {2014}
}
TY - JOUR T1 - Impact of γ-Irradition on Srtucture and Electrophysical Properties of CdMnTe AU - M. A. Mehrabova AU - H. R. Nuriyev AU - T. B. Taghiyev AU - R. M. Sadigov AU - A. M. Nazarov AU - N. I. Huseynov Y1 - 2014/12/27 PY - 2014 N1 - https://doi.org/10.11648/j.ijmsa.s.2014030601.15 DO - 10.11648/j.ijmsa.s.2014030601.15 T2 - International Journal of Materials Science and Applications JF - International Journal of Materials Science and Applications JO - International Journal of Materials Science and Applications SP - 20 EP - 23 PB - Science Publishing Group SN - 2327-2643 UR - https://doi.org/10.11648/j.ijmsa.s.2014030601.15 AB - Cd1-хMnхTe(x=0.05) thin films have been obtained on mica substrates. The surface morphology of samples examined with scanning electron analytical microscope JEOL JSM 7600F and AFM. We obtained Cd1-xMnxTe (х=0.05) thin films of high perfection with smooth and glossy surface and having homogeneous composition of Cd, Te, Mn. The crystal structure of obtained samples was investigated by x-ray diffraction method. It has been found that the synthesized samples and films obtained on mica substrates have a polycrystalline structure and indicated on the base of cubic lattice. It has been studied the impact of γ-irradiation on structure of Cd1-хMnхTe (x=0.05) thin films. The samples were irradiated by γ-ray 3 times at T=300 K. After irradiation the intensity in X-ray diffraction patterns is changed. The x-ray patterns of non-irradiated samples showed all the characteristic scattering peaks. While, the x-ray patterns of irradiated sample appeared different. The irradiated samples showed less degree of crystallinity as evidenced by fewer peaks of lower intensity. We have investigated the influence of -radiation on electrophysical properties of Cd1-хMnхTе thin films at T=300 K. Samples were irradiated 3 times by γ-ray at Dϒ=1051krad doses. As a result the VAC has changed after irradiation in dependence of -irradiation dose. The resistance is changed too. After γ-irradiation till D=30krad doses the photosensitivity is increased but the further increasing of doses leads to disappearing of sensitivity. VL - 3 IS - 6-1 ER -
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