Technological Regimes Searching the Effect of Thermal Annealing on Optical and Electrical Properties of Co/ZnO Multilayer Thin Film of Different Thickness
International Journal of High Energy Physics
Volume 4, Issue 3, June 2017, Pages: 32-35
Received: Jul. 27, 2017; Accepted: Aug. 17, 2017; Published: Sep. 18, 2017
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Authors
Mohammad Faruk Hossain, Department of Physics, Rajshahi University of Engineering and Technology, Rajshahi, Bangladesh
Mohammad Shahidullah Kayser, Department of Applied Physics and Electronic Engineering, University of Rajshahi, Rajshahi, Bangladesh
Mohammad Sarwar Pervez, Department of Natural Science, Varendra University, Rajshahi, Bangladesh
Mohammad Ariful Islam Nahid, Department of Applied Physics and Electronic Engineering, University of Rajshahi, Rajshahi, Bangladesh
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Abstract
The fabrication of the Co/ZnO multilayer thin film for studying the influence of thermal annealing on optical and electrical properties is presented in this paper. In this case, at first Co/ZnO multilayer films were prepared by e-beam evaporation in a vacuum at a pressure of 3.2×10-5 torr. In the multilayer, the thickness of Co and ZnO was kept same. Each layer thickness was varied from 5 nm to 15 nm and repeated three times. The deposition rate of the Co and ZnO thin films are about 1.33 nm/s & 1.43 nm/s respectively. The optical and electrical properties of the deposited and annealed Co/ZnO films had been studied. The average transparency of Co/ZnO multilayer thin film is roughly about 55% and decreased with increasing film thickness and increased when annealed. The T. C. R. of deposited and annealed Co/ZnO multilayer thin films in all cases is negative which indicates that the thin films are semiconducting in nature.
Keywords
Co, ZnO, E-Beam, Multilayer, Optical Properties, Electrical Properties, Thickness
To cite this article
Mohammad Faruk Hossain, Mohammad Shahidullah Kayser, Mohammad Sarwar Pervez, Mohammad Ariful Islam Nahid, Technological Regimes Searching the Effect of Thermal Annealing on Optical and Electrical Properties of Co/ZnO Multilayer Thin Film of Different Thickness, International Journal of High Energy Physics. Vol. 4, No. 3, 2017, pp. 32-35. doi: 10.11648/j.ijhep.20170403.12
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Copyright © 2017 Authors retain the copyright of this article.
This article is an open access article distributed under the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/) which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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