Analysis of Optical Properties of SiO2 Thin Films for Various Thicknesses and Substrate Material Using Matlab Code
American Journal of Materials Synthesis and Processing
Volume 4, Issue 2, December 2019, Pages: 75-80
Received: Oct. 23, 2019; Accepted: Nov. 19, 2019; Published: Nov. 25, 2019
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Authors
Zina Abd Alameer Al Shadidi, Department of Physics Faculty of Education/Sabr, Aden University, Aden, Yemen
Ahmad Kadhum Falih, Department of Physics Faculty of Education, Aden University, Aden, Yemen
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Abstract
Theoretical study using mathematical analysis supported by Matlab code was created, for Silicon dioxide (SiO2) thin films on various substrate materials (Aluminium, quartz, and silicon), and different thicknesses. Reflectance and transmittance of the (SiO2) thin film is strongly dependent on the electromagnetic wavelength. Many physical results were obtained. The results obtained serve as an illustration of the feasibility of simple techniques in measuring precisely the reflectance and absorptance of the (SiO2) thin film with an error not exceeding 0.1%. The reflectance and absorptance characteristics of multilayer thin film are strongly dependent on the wavelength of the electromagnetic waves. The effects of various substrate materials on the reflectance characteristics have been investigated by evaluating the reflectance curves of SiO2 thin films with thickness in the range of (100-1000) nm. The amplitude and periodicity of reflectance and absorptance changed with wavelength. Also the periodicity of this variety change with the film thickness and with the substrate material. In multilayer thin-film devices, the amount of light reflected at each interface can be adjusted by adjusting many factors like film thickness and substrate materials. beams phase can be adjusted by changing the layer thickness. There are thus two parameters associated with each layer, thickness and refractive index difference between film and substrate materials, which can be chosen to give the required performance.
Keywords
SiO2, Optical Properties, Thin Film, Matlab Code
To cite this article
Zina Abd Alameer Al Shadidi, Ahmad Kadhum Falih, Analysis of Optical Properties of SiO2 Thin Films for Various Thicknesses and Substrate Material Using Matlab Code, American Journal of Materials Synthesis and Processing. Vol. 4, No. 2, 2019, pp. 75-80. doi: 10.11648/j.ajmsp.20190402.14
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Copyright © 2019 Authors retain the copyright of this article.
This article is an open access article distributed under the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/) which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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