Software Engineering

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Shibuya Method for Computing Ten Knife Edge Diffraction Loss

Received: 03 January 2017    Accepted: 18 January 2017    Published: 07 June 2017
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Abstract

Shibuya multiple knife edge diffraction loss method is presented in this paper. The Shibuya method is used to compute the effective diffraction loss of ten multiple knife edge obstructions for a 900 MHz GSM network. Each of the ten obstructions gave rise to a virtual hop which resulted in a knife edge diffraction loss while the overall diffraction loss, according to the Shibuya method is the sum of the diffraction loss computed for each of the ten virtual hops. According to the results, the highest line of sight (LOS) clearance height of 8.480769 m and the highest diffraction parameter of 0.397783 occurred in virtual hop 6. On the other hand, the lowest line of sight (LOS) clearance height of 0.628571 m and the lowest diffraction parameter of 0.044447 occurred in virtual hop 9. Furthermore, the highest virtual hop diffraction loss of 9.30294 dB occurred in virtual hop 6 whereas the lowest virtual hop diffraction loss of 6.38736 dB occurred in virtual hop 9. In all, the overall effective diffraction loss for the 10 knife edge obstructions as computed by the Shibuya is 71.7973 dB.

DOI 10.11648/j.se.20170502.12
Published in Software Engineering (Volume 5, Issue 2, March 2017)
Page(s) 38-43
Creative Commons

This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.

Copyright

Copyright © The Author(s), 2024. Published by Science Publishing Group

Keywords

Multiple Knife Edge, Diffraction Loss, Diffraction Parameter, Line of Sight, Clearance Height, Virtual Hop, Shibuya Method

References
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Author Information
  • Department of Electrical/Electronic and Computer Engineering, University of Uyo, Akwa Ibom, Nigeria

  • Department of Electrical/Electronic and Computer Engineering, University of Uyo, Akwa Ibom, Nigeria

  • Department of Electrical/Electronic and Computer Engineering, University of Uyo, Akwa Ibom, Nigeria

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    Oloyede Adams Opeyemi, Ozuomba Simeon, Constance Kalu. (2017). Shibuya Method for Computing Ten Knife Edge Diffraction Loss. Software Engineering, 5(2), 38-43. https://doi.org/10.11648/j.se.20170502.12

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    ACS Style

    Oloyede Adams Opeyemi; Ozuomba Simeon; Constance Kalu. Shibuya Method for Computing Ten Knife Edge Diffraction Loss. Softw. Eng. 2017, 5(2), 38-43. doi: 10.11648/j.se.20170502.12

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    AMA Style

    Oloyede Adams Opeyemi, Ozuomba Simeon, Constance Kalu. Shibuya Method for Computing Ten Knife Edge Diffraction Loss. Softw Eng. 2017;5(2):38-43. doi: 10.11648/j.se.20170502.12

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  • @article{10.11648/j.se.20170502.12,
      author = {Oloyede Adams Opeyemi and Ozuomba Simeon and Constance Kalu},
      title = {Shibuya Method for Computing Ten Knife Edge Diffraction Loss},
      journal = {Software Engineering},
      volume = {5},
      number = {2},
      pages = {38-43},
      doi = {10.11648/j.se.20170502.12},
      url = {https://doi.org/10.11648/j.se.20170502.12},
      eprint = {https://download.sciencepg.com/pdf/10.11648.j.se.20170502.12},
      abstract = {Shibuya multiple knife edge diffraction loss method is presented in this paper. The Shibuya method is used to compute the effective diffraction loss of ten multiple knife edge obstructions for a 900 MHz GSM network. Each of the ten obstructions gave rise to a virtual hop which resulted in a knife edge diffraction loss while the overall diffraction loss, according to the Shibuya method is the sum of the diffraction loss computed for each of the ten virtual hops. According to the results, the highest line of sight (LOS) clearance height of 8.480769 m and the highest diffraction parameter of 0.397783 occurred in virtual hop 6. On the other hand, the lowest line of sight (LOS) clearance height of 0.628571 m and the lowest diffraction parameter of 0.044447 occurred in virtual hop 9. Furthermore, the highest virtual hop diffraction loss of 9.30294 dB occurred in virtual hop 6 whereas the lowest virtual hop diffraction loss of 6.38736 dB occurred in virtual hop 9. In all, the overall effective diffraction loss for the 10 knife edge obstructions as computed by the Shibuya is 71.7973 dB.},
     year = {2017}
    }
    

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  • TY  - JOUR
    T1  - Shibuya Method for Computing Ten Knife Edge Diffraction Loss
    AU  - Oloyede Adams Opeyemi
    AU  - Ozuomba Simeon
    AU  - Constance Kalu
    Y1  - 2017/06/07
    PY  - 2017
    N1  - https://doi.org/10.11648/j.se.20170502.12
    DO  - 10.11648/j.se.20170502.12
    T2  - Software Engineering
    JF  - Software Engineering
    JO  - Software Engineering
    SP  - 38
    EP  - 43
    PB  - Science Publishing Group
    SN  - 2376-8037
    UR  - https://doi.org/10.11648/j.se.20170502.12
    AB  - Shibuya multiple knife edge diffraction loss method is presented in this paper. The Shibuya method is used to compute the effective diffraction loss of ten multiple knife edge obstructions for a 900 MHz GSM network. Each of the ten obstructions gave rise to a virtual hop which resulted in a knife edge diffraction loss while the overall diffraction loss, according to the Shibuya method is the sum of the diffraction loss computed for each of the ten virtual hops. According to the results, the highest line of sight (LOS) clearance height of 8.480769 m and the highest diffraction parameter of 0.397783 occurred in virtual hop 6. On the other hand, the lowest line of sight (LOS) clearance height of 0.628571 m and the lowest diffraction parameter of 0.044447 occurred in virtual hop 9. Furthermore, the highest virtual hop diffraction loss of 9.30294 dB occurred in virtual hop 6 whereas the lowest virtual hop diffraction loss of 6.38736 dB occurred in virtual hop 9. In all, the overall effective diffraction loss for the 10 knife edge obstructions as computed by the Shibuya is 71.7973 dB.
    VL  - 5
    IS  - 2
    ER  - 

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