Journal of Electrical and Electronic Engineering

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Important Improvements of Helium Mass Spectrometry Test for Sealability

Received: 11 December 2018    Accepted: 15 January 2019    Published: 13 February 2019
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Abstract

Helium mass spectrometry test is one of the most commonly used electronic component sealability tests. However, it has a few obvious problems. For components passed test, their reliable storage life time is very uneven. During the test, feasibility of removing absorbed helium is low. High missing detection rate reduces the reliability of the test. Combined relevant patents and papers, and on the basis of theoretical derivation, verified by experimental and case analysis, this paper proposed a series of improvements. They include improvement fine-leak test basic criterion, quantitative determination of the maximum detection-waiting time for fine-leak test, a combination test method by using argon as gross-leak test tracer gas and helium as fine-leak test tracer gas as the core improvement, methods of reducing and preventing detection missing in the gross-leak test and fine-leak test.

DOI 10.11648/j.jeee.20190701.12
Published in Journal of Electrical and Electronic Engineering (Volume 7, Issue 1, February 2019)
Page(s) 8-22
Creative Commons

This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.

Copyright

Copyright © The Author(s), 2024. Published by Science Publishing Group

Keywords

Sealability of Electronic Components, Helium Mass Spectrometry Test, Fine-Leak Test Basic Criterion, Maximum Detection-Waiting Time, Gross/Fine-Leak Combination Test, Argon as Gross-Leak Test Tracer Gas, Detection Missing Prevention

References
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[17] Genglin Wang, Fei Li, Ningbo Li and Yongmin Liu, "Removing Absorbed Helium Testing and its Related Standards", Electronic Product Reliability And Environmental Testing, ISSN1672-5468, Guangzun, Dec.2013, Vol.31, NO.6, pp.5-12.
[18] Genglin Wang, Ningbo Li, Lijun Dong and Fei Li, "A Study and Commentary on NASA Electronic Parts and Packaging Hermeticity Task Overview", Electronic Product Reliability And Environmental Testing, ISSN1672-5468, Guangzun, Apr.2015, Vol.33, NO.2, pp.6-13.
[19] Alan Barone, "IC Moisture Content Issues", Components for Military & Space Electronics Conference Notes, February7-10, 2011.
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[22] Genglin Wang, Fei Li, Caiyi Wang, Ningbo Li, Liyan Wang, Lijun Dong and Yongmin Liu, "Base Criterion and Maximum Dwell Time of Fine Leak Test Using the Helium Mass Spectrometer Leak Detector", Journal of China Academy of Electronic and Information Technology, ISSN1673-5692, Beijing, Apr.2013, Vol.8, NO.2, pp.213-220.
[23] Applicant: Beijing Keytone Electronic Relay Corporation, Inventors: Genglin Wang, Fei Li, Caiyi Wang, Ningbo Li, Method for Helium Mass Spectrometric Fine-Leak Test Besed on Quantitative Determination of Maximum Test-Waiting Time, Chinese invention patent No: ZL 201310047094.3, Application date 06/02/13, Authorization Date 28/12/16. United States invention patent No:14/93.658, Filed 06/12/13, Date of Patent 06/06/17.
[24] Qi An and Xiaoyu Luo, "Analysis of Leak Test with Helium Mass Spectrometer", Electronic Product Reliability And Environmental Testing, ISSN1672-5468, Guangzhou, Aug.2014, Vol.32, NO.4, pp.34-38.
[25] Genglin Wang, Fei Li, Ningbo Li and Yongmin Liu, "Fixed Scheme Design of Helium Mass Spectrometric Fine Leak Detection for Pressing Helium Method and Prefilling Helium Method", Journal of China Academy of Electronics and Information Technology, ISSN1673-5692, Beijing, Dec.2013, Vol.8, NO.6, pp.656-660.
[26] Applicant: Beijing Keytone Electronic Relay Corporation, Inventors: Genglin Wang, Ningbo Li, Fei Li, Yongmin Liu, A Method for Multi-Pressing Helium and Pressing Helium after Prefilling Helium Mass Spectrometric Fine Leak detection. Chinese invention patent No: ZL 20131016115.4, Application date 03/05/13, Authorization Date 04/07/17.
[27] Genglin Wang, Ningbo Li, Fei Li and Yongmin Liu, "Helium Mass Spectrometric Fine Leak Detection Methods Research for Multi-Pressing Helium Method and Pressing Helium after Prefilling Helium Method", Journal of China Academy of Electronics and Information Technology, ISSN1673-5692, Beijing, Feb.2014, Vol.9, NO.1, pp.105-109.
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[29] Applicant: Beijing Keytone Electronic Relay Corporation, Inventors: Genglin Wang, Fei Li, Ningbo Li, Yongmin Liu, Method for Detecting the Sealing Properties of Components by Internal Gas Mass Spectrometry analysis, Chinese invention patent No: ZL 201310504713.7, Application date 23/10/13, Authorization Date 11/01/17.
[30] Applicant: Beijing Keytone Electronic Relay Plant, Inventors: Genglin Wang, Fei Li, Ningbo Li, A Method for Detecting the Sealing Properties of Components by Accumulating Helium Mass Spectrometry gross-leak and fink-leak Combination test, Chinese invention patent No: ZL 201310303714.5, Application date 18/07/13, Authorization Date 11/05/16.
[31] Genglin Wang, Ningbo Li, Fei Li and Lijun Dong, "A Method of Cumulative Helium Gross/Fine Combination Test by Using Argon as Gross-Leak Tracer Gas", Journal of China Academy of Electronics and Information Technology, ISSN1673-5692, Beijing, Aug.2015, Vol.10, NO.4, pp.436-441/447.
[32] Genglin Wang, Ningbo Li, Lijun Dong and Fei Li, "Quantitative Expansion of the Maximum Detection-waiting Time in Helium Mass Spectrometer Fine-leak Test", Journal of China Academy of Electronics and Information Technology, ISSN1673-5692, Beijing, Det.2015, Vol.10, NO.6, pp.48-54.
[33] Applicant and Inventors: Genglin Wang, Ningbo Li, Fei Li, Method of Cumulation Helium Mass Spectrometric Combination Test by Using Argon as Gross-Leak Tracer Gas, Chinese invention patent No: ZL 201310404443.2, Application date 06/09/13, Authorization Date 08/02/17, United States invention patent No:14/134.006, Filed 19/12/13, Date of Patent 16/05/17.
[34] Genglin Wang, Ningbo Li, Lijun Dong, Fei Li and Yongmin Liu, "Methods of Preventing Detection Missing in Accumulative Helium Mass Spectrometry Combination Test", Journal of China Academy of Electronics and Information Technology, ISSN1673-5693, Beijing, Aug.2016, Vol. 11, NO. 4, pp. 407-416.
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[39] Applicant and Inventors: Genglin Wang, Ningbo Li, Lijun Dong, A Combination Test Method by Using Argon as Gross-Leak Test Tracer Gas and Using Helium as Fink-Leak Test Tracer Gas, Chinese invention patent No: ZL 201510199700.2, Application date 23/04/15, Authorization Date 08/09/17, United States invention patent No:14/971.623, Filed 12/16/15, Date of Patent 01/04/19.
Author Information
  • Corporation Headquarter, Beijing Keytone Electronic Relay Corporation, Beijing, China

  • Design Center, Beijing Keytone Electronic Relay Corporation, Beijing, China

  • Corporation Headquarter, Beijing Keytone Electronic Relay Corporation, Beijing, China

  • Production Center, Beijing Keytone Electronic Relay Corporation, Beijing, China

  • Design Center, Beijing Keytone Electronic Relay Corporation, Beijing, China

  • Administration Office, Beijing Keytone Electronic Relay Corporation, Beijing, China

Cite This Article
  • APA Style

    Genglin Wang, Ningbo Li, Wenbin Li, Fei Li, Weigang Wu, et al. (2019). Important Improvements of Helium Mass Spectrometry Test for Sealability. Journal of Electrical and Electronic Engineering, 7(1), 8-22. https://doi.org/10.11648/j.jeee.20190701.12

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    ACS Style

    Genglin Wang; Ningbo Li; Wenbin Li; Fei Li; Weigang Wu, et al. Important Improvements of Helium Mass Spectrometry Test for Sealability. J. Electr. Electron. Eng. 2019, 7(1), 8-22. doi: 10.11648/j.jeee.20190701.12

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    AMA Style

    Genglin Wang, Ningbo Li, Wenbin Li, Fei Li, Weigang Wu, et al. Important Improvements of Helium Mass Spectrometry Test for Sealability. J Electr Electron Eng. 2019;7(1):8-22. doi: 10.11648/j.jeee.20190701.12

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  • @article{10.11648/j.jeee.20190701.12,
      author = {Genglin Wang and Ningbo Li and Wenbin Li and Fei Li and Weigang Wu and Yongmin Liu},
      title = {Important Improvements of Helium Mass Spectrometry Test for Sealability},
      journal = {Journal of Electrical and Electronic Engineering},
      volume = {7},
      number = {1},
      pages = {8-22},
      doi = {10.11648/j.jeee.20190701.12},
      url = {https://doi.org/10.11648/j.jeee.20190701.12},
      eprint = {https://download.sciencepg.com/pdf/10.11648.j.jeee.20190701.12},
      abstract = {Helium mass spectrometry test is one of the most commonly used electronic component sealability tests. However, it has a few obvious problems. For components passed test, their reliable storage life time is very uneven. During the test, feasibility of removing absorbed helium is low. High missing detection rate reduces the reliability of the test. Combined relevant patents and papers, and on the basis of theoretical derivation, verified by experimental and case analysis, this paper proposed a series of improvements. They include improvement fine-leak test basic criterion, quantitative determination of the maximum detection-waiting time for fine-leak test, a combination test method by using argon as gross-leak test tracer gas and helium as fine-leak test tracer gas as the core improvement, methods of reducing and preventing detection missing in the gross-leak test and fine-leak test.},
     year = {2019}
    }
    

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  • TY  - JOUR
    T1  - Important Improvements of Helium Mass Spectrometry Test for Sealability
    AU  - Genglin Wang
    AU  - Ningbo Li
    AU  - Wenbin Li
    AU  - Fei Li
    AU  - Weigang Wu
    AU  - Yongmin Liu
    Y1  - 2019/02/13
    PY  - 2019
    N1  - https://doi.org/10.11648/j.jeee.20190701.12
    DO  - 10.11648/j.jeee.20190701.12
    T2  - Journal of Electrical and Electronic Engineering
    JF  - Journal of Electrical and Electronic Engineering
    JO  - Journal of Electrical and Electronic Engineering
    SP  - 8
    EP  - 22
    PB  - Science Publishing Group
    SN  - 2329-1605
    UR  - https://doi.org/10.11648/j.jeee.20190701.12
    AB  - Helium mass spectrometry test is one of the most commonly used electronic component sealability tests. However, it has a few obvious problems. For components passed test, their reliable storage life time is very uneven. During the test, feasibility of removing absorbed helium is low. High missing detection rate reduces the reliability of the test. Combined relevant patents and papers, and on the basis of theoretical derivation, verified by experimental and case analysis, this paper proposed a series of improvements. They include improvement fine-leak test basic criterion, quantitative determination of the maximum detection-waiting time for fine-leak test, a combination test method by using argon as gross-leak test tracer gas and helium as fine-leak test tracer gas as the core improvement, methods of reducing and preventing detection missing in the gross-leak test and fine-leak test.
    VL  - 7
    IS  - 1
    ER  - 

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