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Broad Beam and Gamma Spectrometric Parameters of Some Granites
Radiation Science and Technology
Volume 5, Issue 4, December 2019, Pages: 47-52
Received: Oct. 3, 2019; Accepted: Oct. 31, 2019; Published: Nov. 7, 2019
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Abdul-Hamid Hussein El-Kateb, Faculty of Science, Helwan University, Helwan, Cairo, Egypt
Asmaa Sophy Seif El-Nasr, Faculty of Science, Helwan University, Helwan, Cairo, Egypt
Mahmoud Mohamed Bakry, Faculty of Science, Helwan University, Helwan, Cairo, Egypt
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Using a g-ray spectrometer with 3"x3" NaI (Tl) detector the linear and mass attenuation coefficients (m/r) and (mb/r) from narrow and broad beam experimental arrangements have been measured and compared with the theoretical values for the granites Double Black, DB, from India, Rose Al-Howdy, RH, from Aswan, south Egypt and Bianco Halayeb, BK, from Halayeb, south Egypt. The photon energies lei in the range 0.081-1.332 MeV from the radioisotopes 133Ba, 137Cs and 60Co. The build-up factor B, the effective atomic number Zeff, and the total atomic cross-section st for the granites as a function of photon energy were determined and discussed. It is found that the experimental results are consistent, within the experimental errors, with the theoretical values. The effective atomic number Zeff, the build-up factor B, and the total atomic cross-section st were calculated and discussed as a function of photon energy. The B factor is large at low gamma energy and not sensitive for discrimination between the granites. The maximum Zeff corresponds to minimum B factor at the photon energy 0.356 MeV. The broad beam geometry is more efficient than narrow beam geometry in characterizing the shielding properties of the studied granites.
Gamma-ray Spectrometry, Radiation Protection, Mass Attenuation Coefficients, Build-up Factor, Effective Atomic Number, Total Atomic Cross-section
To cite this article
Abdul-Hamid Hussein El-Kateb, Asmaa Sophy Seif El-Nasr, Mahmoud Mohamed Bakry, Broad Beam and Gamma Spectrometric Parameters of Some Granites, Radiation Science and Technology. Vol. 5, No. 4, 2019, pp. 47-52. doi: 10.11648/j.rst.20190504.13
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