American Journal of Physics and Applications

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Construction of Sheet Resistance Measurement Setup for Tin Dioxide Film Using Four Probe Method

Received: 16 January 2017    Accepted: 25 January 2017    Published: 03 August 2017
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Abstract

The main purpose of the paper is to construct the four probes to calculate the sheet resistance the thin film. For the thin film this paper presents the experimental preparation of Tin dioxide thin films. A dual voltage power supply and constant current source is developed to study deeply for the constant current output. Electrical properties are measured using constant current source, sheet resistance, four probe), digital multimeter and micro ammeter. The effect of thickness of sheet resistance thin film is carried out by four probe method.

DOI 10.11648/j.ajpa.20170505.11
Published in American Journal of Physics and Applications (Volume 5, Issue 5, September 2017)
Page(s) 60-65
Creative Commons

This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.

Copyright

Copyright © The Author(s), 2024. Published by Science Publishing Group

Keywords

Tin Dioxide, Four Probe, Spin Coating Method, Sheet Resistance

References
[1] Patil Ganesh E., Kajale DD., Chavan DN., Pawar NK., Ahire PT., Shinde SD, Gaikwad VB. and Jain GH. (February 2011). Synthesis, characterization and gas sensing performance of SnO2 thin films prepared by spray pyrolysis, Bull. Mater. Sci., Vol. 34, No. 1, pp. 1–9.
[2] Optical properties of spin coated Cu doped ZnO nanocomposite films, P. Samarasekara and Udumbara.
[3] Ng ZiNeng, Fabrication and characterization of ZnO thin films using Sol-Gel spin coating.
[4] G. G. Valle, P. Hammer, S. H. Pulcinelli and C. V. Santilli, “Transparent and Conductive ZnO: Al Thin Films Prepared by Sol-Gel Dip-Coating,” Journal of European Ceramic Society, Vol. 24, No. 6, (2004), pp. 1009-1013. doi: 10.1016/S0955-2219(03)00597-1.
[5] https://en.wikipedia.org/wiki/Regulated_power_supply
[6] http://www.electronics-lab.com/project/dual-voltage-power-supply/
[7] https://en.wikipedia.org/wiki/Current_source
[8] Malvino, Electronic Principles, 6thed
[9] https://en.wikipedia.org/wiki/Four terminal_sensing
[10] https://en.wikipedia.org/wiki/Sheet_resistan elm
[11] Mahato R. R. (2008). (Master's Thesis) Electrical And Optical Properties of Deposited ZnO And ZnO-Al Thin Films Prepared by Pyrolysis method, Department of Physics, University Campus, pp. 35-37.
Author Information
  • Department of Physics, Tri-Chandra Multiple Campus, Kathmandu, Nepal

  • Department of Physics, Patan Multiple Campus, Patandhoka, Nepal

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  • APA Style

    Rikesh Bhattarai, Shankar Prasad Shrestha. (2017). Construction of Sheet Resistance Measurement Setup for Tin Dioxide Film Using Four Probe Method. American Journal of Physics and Applications, 5(5), 60-65. https://doi.org/10.11648/j.ajpa.20170505.11

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    ACS Style

    Rikesh Bhattarai; Shankar Prasad Shrestha. Construction of Sheet Resistance Measurement Setup for Tin Dioxide Film Using Four Probe Method. Am. J. Phys. Appl. 2017, 5(5), 60-65. doi: 10.11648/j.ajpa.20170505.11

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    AMA Style

    Rikesh Bhattarai, Shankar Prasad Shrestha. Construction of Sheet Resistance Measurement Setup for Tin Dioxide Film Using Four Probe Method. Am J Phys Appl. 2017;5(5):60-65. doi: 10.11648/j.ajpa.20170505.11

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  • @article{10.11648/j.ajpa.20170505.11,
      author = {Rikesh Bhattarai and Shankar Prasad Shrestha},
      title = {Construction of Sheet Resistance Measurement Setup for Tin Dioxide Film Using Four Probe Method},
      journal = {American Journal of Physics and Applications},
      volume = {5},
      number = {5},
      pages = {60-65},
      doi = {10.11648/j.ajpa.20170505.11},
      url = {https://doi.org/10.11648/j.ajpa.20170505.11},
      eprint = {https://download.sciencepg.com/pdf/10.11648.j.ajpa.20170505.11},
      abstract = {The main purpose of the paper is to construct the four probes to calculate the sheet resistance the thin film. For the thin film this paper presents the experimental preparation of Tin dioxide thin films. A dual voltage power supply and constant current source is developed to study deeply for the constant current output. Electrical properties are measured using constant current source, sheet resistance, four probe), digital multimeter and micro ammeter. The effect of thickness of sheet resistance thin film is carried out by four probe method.},
     year = {2017}
    }
    

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  • TY  - JOUR
    T1  - Construction of Sheet Resistance Measurement Setup for Tin Dioxide Film Using Four Probe Method
    AU  - Rikesh Bhattarai
    AU  - Shankar Prasad Shrestha
    Y1  - 2017/08/03
    PY  - 2017
    N1  - https://doi.org/10.11648/j.ajpa.20170505.11
    DO  - 10.11648/j.ajpa.20170505.11
    T2  - American Journal of Physics and Applications
    JF  - American Journal of Physics and Applications
    JO  - American Journal of Physics and Applications
    SP  - 60
    EP  - 65
    PB  - Science Publishing Group
    SN  - 2330-4308
    UR  - https://doi.org/10.11648/j.ajpa.20170505.11
    AB  - The main purpose of the paper is to construct the four probes to calculate the sheet resistance the thin film. For the thin film this paper presents the experimental preparation of Tin dioxide thin films. A dual voltage power supply and constant current source is developed to study deeply for the constant current output. Electrical properties are measured using constant current source, sheet resistance, four probe), digital multimeter and micro ammeter. The effect of thickness of sheet resistance thin film is carried out by four probe method.
    VL  - 5
    IS  - 5
    ER  - 

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