Construction of Sheet Resistance Measurement Setup for Tin Dioxide Film Using Four Probe Method
American Journal of Physics and Applications
Volume 5, Issue 5, September 2017, Pages: 60-65
Received: Jan. 16, 2017; Accepted: Jan. 25, 2017; Published: Aug. 3, 2017
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Authors
Rikesh Bhattarai, Department of Physics, Tri-Chandra Multiple Campus, Kathmandu, Nepal
Shankar Prasad Shrestha, Department of Physics, Patan Multiple Campus, Patandhoka, Nepal
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Abstract
The main purpose of the paper is to construct the four probes to calculate the sheet resistance the thin film. For the thin film this paper presents the experimental preparation of Tin dioxide thin films. A dual voltage power supply and constant current source is developed to study deeply for the constant current output. Electrical properties are measured using constant current source, sheet resistance, four probe), digital multimeter and micro ammeter. The effect of thickness of sheet resistance thin film is carried out by four probe method.
Keywords
Tin Dioxide, Four Probe, Spin Coating Method, Sheet Resistance
To cite this article
Rikesh Bhattarai, Shankar Prasad Shrestha, Construction of Sheet Resistance Measurement Setup for Tin Dioxide Film Using Four Probe Method, American Journal of Physics and Applications. Vol. 5, No. 5, 2017, pp. 60-65. doi: 10.11648/j.ajpa.20170505.11
Copyright
Copyright © 2017 Authors retain the copyright of this article.
This article is an open access article distributed under the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/) which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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