American Journal of Physics and Applications

| Peer-Reviewed |

Research on Calibration Method of 7kV Single Voltage Pulse for IGBT Models Test System

Received: 25 August 2017    Accepted: 27 September 2017    Published: 20 October 2017
Views:       Downloads:

Share This Article

Abstract

Power IGBT module is widely used in high power conversion applications in various fields because of the advantages of high voltage and high current applications. In order to avoid the influence of temperature rise to the device measurement, pulse test method is widely used to test its static and dynamic parameters, So there are single high pulse voltage source and single pulse high current source in power IGBT modules test instruments. For now in the metrology field, how to calibrate its Single High Pulse Voltage source is a difficult problem. Now the amplitude of single high pulse voltage source is above 7kV with the pulse width as 50 microseconds. Based on detailed research on the test principles of the power IGBT modules test instruments, the pulse high voltage divider and the data acquisition unit are used to setup a calibration device for Single High Pulse Voltage source to calibrate the amplitude of Single High Pulse Voltage source. Resistors are usedto develop the pulse high voltage divider, and did carefully research on the pulse response time, voltage dispersion, voltage regulation of the pulse high voltage divider. Also the data acquisition unit with 20MHz bandwidth and 100MS/s acquisition rate is evaluated through tests including vertical accuracy test, bandwidth test, rise time test, comparison test and etc.. Through above relevant test results, with the comprehensive consideration of the influence of each measurement uncertainty component, It have finished that the evaluation of the uncertainties of the amplitude measurement for Single High Pulse Voltage source. The uncertainty of measurement is better than 2% with the coverage factor as 2.

DOI 10.11648/j.ajpa.20170506.13
Published in American Journal of Physics and Applications (Volume 5, Issue 6, November 2017)
Page(s) 91-94
Creative Commons

This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.

Copyright

Copyright © The Author(s), 2024. Published by Science Publishing Group

Keywords

Power IGB, Single High Pulse Voltage Source, Pulse Test Method, Calibrate

References
[1] Zhang Yufeng, Liu Chong, Yu Lihong, in: Research on Calibration Technology of power IGBT module test equipment, December 2014 of Electronics today.
[2] Huang Nannan, Zhu Wangchun, Liu Chong, in: Design and implementation of pulse current source for power semiconductor device testing, Electronic technology and software engineering, 2016, pp.23–26.
[3] I. S. Jacobs and C. P. Bean, “Fine particles, thin films and exchange anisotropy,” in Magnetism, vol. III, G. T. Rado and H. Suhl, Eds. New York: Academic, 1963, pp. 271–350.
[4] Information on http://www.chinacesi.com.
[5] G. Henkelman, G. Johannesson and H. Jónsson, in: Theoretical Methods in Condencsed Phase Chemistry, edited by S. D. Schwartz, volume 5 of Progress in Theoretical Chemistry and Physics, chapter, 10, Kluwer Academic Publishers (2000).
[6] Y. Mishing, in: Diffusion Processes in Advanced Technological Materials, edtied by D. Gupta Noyes Publications/William Andrew Publising, Norwich, NY (2004), in press.
[7] Dj. M. Maric, P. F. Meier and S. K. Estreicher: Mater. Sci. Forum Vol. 83-87 (1992), p. 119.
[8] Lai Ping, “Power microwave devices dynamic test system”. Semiconductor Technology. Vol. 5, 2007.
[9] Y. Mishing, in: Diffusion Processes in Advanced Technological Materials, edtied by D. Gupta Noyes Publications/William Andrew Publising, Norwich, NY (2004), in press.
[10] G. Henkelman, G. Johannesson and H. Jónsson, in: Theoretical Methods in Condencsed Phase Chemistry, edited by S. D. Schwartz, volume 5 of Progress in Theoretical Chemistry and Physics, chapter, 10, Kluwer Academic Publishers (2000).
Author Information
  • China Electronics Standardization Institute, Beijing, China

  • China Electronics Standardization Institute, Beijing, China

  • China Electronics Standardization Institute, Beijing, China

Cite This Article
  • APA Style

    Liu Chong, Li Jie, Kan Jingsong. (2017). Research on Calibration Method of 7kV Single Voltage Pulse for IGBT Models Test System. American Journal of Physics and Applications, 5(6), 91-94. https://doi.org/10.11648/j.ajpa.20170506.13

    Copy | Download

    ACS Style

    Liu Chong; Li Jie; Kan Jingsong. Research on Calibration Method of 7kV Single Voltage Pulse for IGBT Models Test System. Am. J. Phys. Appl. 2017, 5(6), 91-94. doi: 10.11648/j.ajpa.20170506.13

    Copy | Download

    AMA Style

    Liu Chong, Li Jie, Kan Jingsong. Research on Calibration Method of 7kV Single Voltage Pulse for IGBT Models Test System. Am J Phys Appl. 2017;5(6):91-94. doi: 10.11648/j.ajpa.20170506.13

    Copy | Download

  • @article{10.11648/j.ajpa.20170506.13,
      author = {Liu Chong and Li Jie and Kan Jingsong},
      title = {Research on Calibration Method of 7kV Single Voltage Pulse for IGBT Models Test System},
      journal = {American Journal of Physics and Applications},
      volume = {5},
      number = {6},
      pages = {91-94},
      doi = {10.11648/j.ajpa.20170506.13},
      url = {https://doi.org/10.11648/j.ajpa.20170506.13},
      eprint = {https://download.sciencepg.com/pdf/10.11648.j.ajpa.20170506.13},
      abstract = {Power IGBT module is widely used in high power conversion applications in various fields because of the advantages of high voltage and high current applications. In order to avoid the influence of temperature rise to the device measurement, pulse test method is widely used to test its static and dynamic parameters, So there are single high pulse voltage source and single pulse high current source in power IGBT modules test instruments. For now in the metrology field, how to calibrate its Single High Pulse Voltage source is a difficult problem. Now the amplitude of single high pulse voltage source is above 7kV with the pulse width as 50 microseconds. Based on detailed research on the test principles of the power IGBT modules test instruments, the pulse high voltage divider and the data acquisition unit are used to setup a calibration device for Single High Pulse Voltage source to calibrate the amplitude of Single High Pulse Voltage source. Resistors are usedto develop the pulse high voltage divider, and did carefully research on the pulse response time, voltage dispersion, voltage regulation of the pulse high voltage divider. Also the data acquisition unit with 20MHz bandwidth and 100MS/s acquisition rate is evaluated through tests including vertical accuracy test, bandwidth test, rise time test, comparison test and etc.. Through above relevant test results, with the comprehensive consideration of the influence of each measurement uncertainty component, It have finished that the evaluation of the uncertainties of the amplitude measurement for Single High Pulse Voltage source. The uncertainty of measurement is better than 2% with the coverage factor as 2.},
     year = {2017}
    }
    

    Copy | Download

  • TY  - JOUR
    T1  - Research on Calibration Method of 7kV Single Voltage Pulse for IGBT Models Test System
    AU  - Liu Chong
    AU  - Li Jie
    AU  - Kan Jingsong
    Y1  - 2017/10/20
    PY  - 2017
    N1  - https://doi.org/10.11648/j.ajpa.20170506.13
    DO  - 10.11648/j.ajpa.20170506.13
    T2  - American Journal of Physics and Applications
    JF  - American Journal of Physics and Applications
    JO  - American Journal of Physics and Applications
    SP  - 91
    EP  - 94
    PB  - Science Publishing Group
    SN  - 2330-4308
    UR  - https://doi.org/10.11648/j.ajpa.20170506.13
    AB  - Power IGBT module is widely used in high power conversion applications in various fields because of the advantages of high voltage and high current applications. In order to avoid the influence of temperature rise to the device measurement, pulse test method is widely used to test its static and dynamic parameters, So there are single high pulse voltage source and single pulse high current source in power IGBT modules test instruments. For now in the metrology field, how to calibrate its Single High Pulse Voltage source is a difficult problem. Now the amplitude of single high pulse voltage source is above 7kV with the pulse width as 50 microseconds. Based on detailed research on the test principles of the power IGBT modules test instruments, the pulse high voltage divider and the data acquisition unit are used to setup a calibration device for Single High Pulse Voltage source to calibrate the amplitude of Single High Pulse Voltage source. Resistors are usedto develop the pulse high voltage divider, and did carefully research on the pulse response time, voltage dispersion, voltage regulation of the pulse high voltage divider. Also the data acquisition unit with 20MHz bandwidth and 100MS/s acquisition rate is evaluated through tests including vertical accuracy test, bandwidth test, rise time test, comparison test and etc.. Through above relevant test results, with the comprehensive consideration of the influence of each measurement uncertainty component, It have finished that the evaluation of the uncertainties of the amplitude measurement for Single High Pulse Voltage source. The uncertainty of measurement is better than 2% with the coverage factor as 2.
    VL  - 5
    IS  - 6
    ER  - 

    Copy | Download

  • Sections