Special Issue Submission Closed

Fine-Grained Image Analysis

01About This Special Issue

Thanks to the development of deep learning, promising image classification and retrieval performance within a set of predefined categories can be achieved without extra object-based bounding boxes or dense keypoint-based annotation information in recent years. However, fine-grained image analysis (FGIA) including image recognition and retrieval within sub-categories are much more challenging problem than general image recognition and retrieval due to the small inter-class and large intra-class variation. Related researches of FGIA technology have been widely and successfully applied in smart retail, intelligent transportation, biodiversity conservation and crime prevention. The task of FGIA targets recognizing the variances among images categorized in subordinate classes, e.g., species of birds, types of cars or species of flowers. The main research subjects of FGIA contain two fundamental fine-grained research areas i.e., fine-grained image recognition and fine-grained image retrieval.

Potential topics include but are not limited to the following:

  1. (1) Fine-Grained Image Recognition
  2. (2) Fine-Grained Image Retrieval
  3. (3) Fine-Grained Object Co-Localization and Object Part Mining
  4. (4) Discriminative Detailed Feature Learning
  5. (5) Fine-Grained Learning for Visual Question Answering
  6. (6) Fine-Grained Image Hashing
  7. (7) Fine-Grained Remote Sensing Image Information Extraction
  8. (8) Fine-Grained 3D Point Clouds Measurement
A list of the paper types that you will consider for this SI e.g. research/review/case study/brief. This list should not exceed the paper types normally considered in this journal.

02Meet the Guest Editors

Our distinguished editors bring deep subject-matter expertise to curate high-quality research and ensure a rigorous peer-review process.

Lead Guest Editor

Lei Ma

School of Electrical and Information Engineering, Wuhan Institute of Technology, Wuhan, China

Guest Editor

Yu Shi

School of Electrical and Information Engineering,Wuhan Institute of Technology, Wuhan, China

Guest Editor

Chunhua Deng

School of Computer Science and Technology,Wuhan University of Science and Technology, Wuhan, China

Guest Editor

Lei Wang

School of Electrical and Information Engineering, Wuhan Institute of Technology, Wuhan, China

Guest Editor

Tiecheng Song

School of Communication and Information Engineering, Chongqing University of Posts and Telecommunications, Wuhan, China

Guest Editor

Jinmeng Wu

School of Electrical and Information Engineering, Wuhan Institute of Technology, Wuhan, China

Guest Editor

Ying Zhu

School of Electrical and Information Engineering,Wuhan Institute of Technology, Wuhan, China